X-Ray Diffractometer (XRD)
X-ray diffraction is a non-destructive technique which uses Bragg’s law for analysing a wide range of materials including metals, minerals, catalysts, pharmaceuticals, thin-films, coatings, ceramics, and semiconductors. The technique finds innumerable applications in various industries, including microelectronics, power generation, aerospace, and etc. X-ray powder diffraction is most widely used for the identification of unknown crystalline materials (e.g., minerals, inorganic compounds) with detection limit » 2% of sample.
MAKE : Thermofisher Scientific Ltd.
MODEL NUMBER : ARL EQUINOX 3000
Technical Specifications:
| Scanning range | : | 0 - 120° (2θ) simultaneous 2θ acquisition in asymmetric geometry |
| Goniometer | : | Fixed goniometer system |
| Detector | : | Curved Position Sensitive X-ray Detector, CPS120 |
| X-ray tube | : | Cu Kα 1 radiation |
| Sample holders | : | Fixed (No realignment needed) |
| Type of samples | : | Bulk powder, thin films, foils and thin plates |
| Temperature | : | Room temperature to high temperature (1000 °C) |
| Applications | : | Crystal structure, Rietveld analysis, Phase transition, Thermal expansion, Cell parameters, Lattice strain, Crystallite size, Phase identification |
Consultancy Charge Details:
| Type | Internal(Student & Staff) (Rs.) | External Educational Institution / R&D) (Rs.) | Industry(Rs.) | |
| Powder per sample | 300 | 400 | 1000 | |
| GIXRD per Thin Film Sample | 400 | 600 | 1500 | |
| High Temperature XRD | RT - 500 °C per scan | 1000 | 1500 | 3000 |
| RT - 1000 °C per scan | 1500 | 2000 | 4000 | |
User Instuctions & Consultancy Form
Staff-Incharge:
Dr. D. Ramachandran, Assistant Professor (Research)
Dr B. Vigneshwaran, Assistant Professor (Research)
Contact Details:
| Email ID | : | ramnaami@gmail.com vigneshwaranjpt@gmail.com |
| Phone No. | : | Dr. D. Ramachandran (+91- 98849 57212) Dr B. Vigneshwaran (+91-97894 46048) |