Field Emission Scanning Electron Microscopy (FESEM)

Field emission scanning electron microscope (FESEM) is one of the common methods for imaging the microstructure and morphology of materials. The field emission gun (FEM) provides a pointed sharp tip as the electron source for higher resolution and magnified images. An energy dispersive X-ray spectrometer (EDS) is used for elemental analysis to confirm the presence of elements in a given material. The technique is used to gain insights into morphology with compositional details of engineered and novel materials both in bulk and thin film forms.

MAKE : CARL ZEISS
MODEL NUMBER : Sigma 300

Technical Specifications:

Nominal resolution	:	1.5 nm at 10 kV
Acceleration voltage	:	0.1 - 30 kV
Probe current	:	4 pA-10 nA
Magnification	:	12 - 900,000 X
Working Distance	:	<10mm

Consultancy Charge Details:

Type	Internal(Student & Staff) (Rs.)	External Educational Institution / R&D) (Rs.)	Industry(Rs.)
FESEM	1500	1700	3400
FESEM with EDS	2000	2200	4200
EDS	1500	1700	3400

User Instuctions & Consultancy Form

Staff-Incharge:

Dr. K. Viswanathan, Assistant Professor (Research)

Contact Details:

Email ID	:	viswanathan@sathyabama.ac.in
Phone No.	:	Dr. K. Viswanathan (+91- 91766 19444)