Atomic Force Microscopy (AFM)
AFM is used to create high-resolution images of surfaces at the nanoscale, allowing for the visualization of surface topography and features.
MAKE : NTEGRA Prima
MODEL NUMBER : NTMDT, Ireland
Technical Specifications:
NTEGRA Prima is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy (Surface Topography, Roughness, Histogram)
| Scan type | : | Scanning by sample |
| Sample size | : | 1 x 1 cm |
| Sample weight | : | Up to 100 g |
| XY sample positioning | : | 5 x 5 mm |
| Scan range | : | 100 x 100 x 10 µm |
Consultancy Charge Details:
| Type | Internal(Student & Staff) (Rs.) | External Educational Institution / R&D) (Rs.) | Industry(Rs.) |
| AFM sample | 2000 | 2300 | 4600 |
User Instuctions & Consultancy Form
Staff-Incharge:
Dr. D. Ramachandran, Assistant Professor (Research)
Contact Details:
| Email ID | : | ramnaami@gmail.com / ddkumar86@gmail.com |
| Phone No. | : | Dr. D. Ramachandran (+91- 9884957212) |